Multi-DUT Parallel Testing Becomes Standard Requirement
Semiconductor manufacturers are increasingly specifying probe cards capable of testing multiple devices simultaneously to maximize tester utilization and reduce per-unit test cost as chip production volumes climb across memory and logic device categories. Multi-DUT probe cards now capture roughly 38 percent of new probe card deployments, up from under 20 percent five years earlier, as manufacturers increasingly view parallel test capability as essential rather than optional for cost-competitive high-volume production. This shift is reshaping probe card design complexity and pushing suppliers toward more sophisticated multi-site engineering capability across their product portfolios.
Market Impact: Advanced node capex grows 12%+ yearly








